diff --git a/source/Charge.en.tex b/source/Charge.en.tex index cf3844a9e65fb41b54dcdb909a39d48f206ab73c..4db65dc91741b5d9d239b6e6c02639fb88b7d640 100644 --- a/source/Charge.en.tex +++ b/source/Charge.en.tex @@ -3,8 +3,8 @@ The \defii{total}{charge} denoted by $\TotalCharge$ describes the net charge entering the right hand side of the Poisson equation. It is composed by the \trefii[DopingProfile]{doping}{profile} and the - \atrefii[DensityElectrons]{electron}{electron}{density} and - \atrefii[DensityHoles]{hole densities}{hole}{density} by + \mtrefi[DensityElectrons?electron-density]{electron} and + \mtrefi[DensityHoles?hole-density]{hole densities} by $\TotalCharge =\realtimes{-\ElementaryCharge,\realminus{\realplus{\DopingProfile,\DensityHoles},\DensityElectrons}}$. \end{definition} diff --git a/source/OneDimDevice.en.tex b/source/OneDimDevice.en.tex index 57d075199dae1d578f7bf0630278eb4282def191..430ded25a23e7f237d7083ed8ad7e7c4a87b2c8c 100644 --- a/source/OneDimDevice.en.tex +++ b/source/OneDimDevice.en.tex @@ -1,7 +1,7 @@ \begin{mhmodnl}{OneDimDevice}{en} \begin{definition} A \trefi[Device]{device} is called \defi{one-dimensional}, iff all of its - \atrefii[Device]{properties}{device}{property} \trefi[DeviceGeometry]{domain} are + \mtrefi[Device?device-property]{properties} \trefi[DeviceGeometry]{domain} are translation-invariant in two directions \end{definition} \end{mhmodnl} diff --git a/source/TwoDimDevice.en.tex b/source/TwoDimDevice.en.tex index 43eea08ef58ba1f63e6347552fa7038197c407fa..8ccc72dffbd23a3d827f8fda1d755b2032fbd774 100644 --- a/source/TwoDimDevice.en.tex +++ b/source/TwoDimDevice.en.tex @@ -1,7 +1,7 @@ \begin{mhmodnl}{TwoDimDevice}{en} \begin{definition} A \trefi[Device]{device} is called \defi{two-dimensional}, iff all of its - \atrefii[Device]{properties}{device}{property} \trefi[DeviceGeometry]{domain} are + \mtrefi[Device?device-property]{properties} \trefi[DeviceGeometry]{domain} are translation-invariant in one direction. \end{definition} \end{mhmodnl} diff --git a/supplement/WIAS-preprint_2263_snippet/hbchapter.tex b/supplement/WIAS-preprint_2263_snippet/hbchapter.tex index 188b0d5fbe3ae858bae2259ac007ca8ad76c40bd..0f286389c7446278e7251d9d8ffdc160970f8546 100644 --- a/supplement/WIAS-preprint_2263_snippet/hbchapter.tex +++ b/supplement/WIAS-preprint_2263_snippet/hbchapter.tex @@ -152,8 +152,7 @@ constants. The (absolute) \trefii[PoissonParameters]{dielectric}{permittivity} $\DielectricPermitivity = \realtimes{\VacuumDielectricPermitivity,\RelativeDielectricPermitivity}$ is given as the product of the \trefiii[PoissonParameters]{vacuum}{dielectric}{permittivity} -$\VacuumDielectricPermitivity$ and the \atrefiii[PoissonParameters]{relative - permittivity}{relative}{dielectric}{permittivity} of the semiconductor +$\VacuumDielectricPermitivity$ and the \mtrefi[PoissonParameters?relative-dielectric-permittivity]{relative permittivity} of the semiconductor $\RelativeDielectricPermitivity$ in static (low frequency) limit. The carrier mobilities $\ElectronMobility$ and $\HoleMobility$, the conduction and valence band densities of states $\DOSConductionBand$ and $\DOSValenceBand$ as well as the conduction and valence band-edge energies $E_c$ and